| Overview
TECHNICAL
PROGRAM INCLUDES:
- Award-winning
presentations
- Comprehensive
workshops
- Distinguished
lectures
- Emerging Trends
in Engineering Education poster
session
- Interactive poster
and oral presentations
- Main Plenary
Socratic Roundtable
- Panel discussions
- Professional
tours
SESSIONS
WILL FOCUS ON:
- ABET accreditation
- Assessment
- Communications
- Distance education
- Diversity
- Educational methods
- Engineering and
engineering technology curricula
- Industrial partnerships
- K-12
- Professional
development
- Retention
- Web technology
Deans, faculty, industry and government
representatives, along with international
leaders in education will give presentations.
ASEE division peer-reviewed papers
will be published on a searchable
disk.
Proceedings
Workstations
Proceedings workstations will be
available in the ASEE registration
area in the Hyatt Regency.
Internet
Kiosks
Internet kiosks will be available
in the ASEE exhibit hall.
Conference
Proceedings
A disk of the conference proceedings
is included in your program book.
This lightweight version of the
proceedings includes a reverse index,
making it easy to sort information.
Workstations to view the disk will
also be available.
Proceedings
Online
Annual conference proceedings will
be available online after the conference
at
www.asee.org/about/events/conferences/search.cfm
.
ASEE
Annual Conference Best Paper Program
Winners of the 2005 Best Paper awards
will be honored at the 2006 Annual
Awards Banquet on Wednesday evening.
Award winners for 2006 will be notified
that they have won after the conference
is over.
Award Categories
- Best Professional Interest
Council Paper (PIC): $1,000 each
to the best paper from PIC I,
PIC II, PIC III, PIC IV and PIC
V.
- Best Zone Paper: $1,000 to
the paper named Best Zone Paper.
- Best Conference Paper: $3,000
(The Best Conference Paper will
be
selected from the best PIC papers
and the Best Zone paper. The winner
will receive the $1,000 award
for Best PIC or Zone paper plus
an additional $2,000 for Best
Conference Paper.)
For the most current program
please visit www.asee.org/annual2006
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